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Characterisation of Radiation Damage by Transmission Electron Microscopy
Characterisation of Radiation Damage by Transmission Electron Microscopy
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Characterisation of Radiation Damage by Transmission Electron Microscopy

2.890 kr.

2.890 kr.

Tidligere laveste pris:

2.928 kr.

På lager

Tors., 17 juli - tirs., 22 juli


Sikker betaling

14 dages åbent køb


Sælges og leveres af

Adlibris

Produktbeskrivelse

Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

Varenr.

05b850f1-4748-4031-b467-eaeaa69dc8b7

Characterisation of Radiation Damage by Transmission Electron Microscopy

2.890 kr.

2.890 kr.

Tidligere laveste pris:

2.928 kr.

På lager

Tors., 17 juli - tirs., 22 juli


Sikker betaling

14 dages åbent køb


Sælges og leveres af

Adlibris